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EELS in STEM: the “Swiss Army Knife” of Spectroscopy

Published online by Cambridge University Press:  05 August 2019

Juan Carlos Idrobo ,
Andrea Konečná ,
Jaume Gazquez ,
Jordan A. Hachtel ,
Tracy C. Lovejoy ,
Niklas Dellby ,
F. Javier García de Abajo ,
Mathieu Kociak ,
Javier Aizpurua  and
Ondrej L. Krivanek
Juan Carlos Idrobo*
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TNUSA.
Andrea Konečná
Affiliation:
Materials Physics Center, CSIC-UPV/EHU, 20018 Donostia-San Sebastián, Spain.
Jaume Gazquez
Affiliation:
Institut de Ciència de Materials de Barcelona, Campus de la UAB, 08193 Bellaterra, Spain
Jordan A. Hachtel
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TNUSA.
Tracy C. Lovejoy
Affiliation:
Nion Company, 11511 NE 118th St, Kirkland, WAUSA.
Niklas Dellby
Affiliation:
Nion Company, 11511 NE 118th St, Kirkland, WAUSA.
F. Javier García de Abajo
Affiliation:
ICFO-Institut de Ciencies Fotoniques, The Barcelona Institute of Science and Technology, 08860 Castelldefels (Barcelona), Spain. ICREA-Institucó Catalana de Recerca i Estudis Avançats, Passeig Lluís Companys 23, 08010 Barcelona, Spain.
Mathieu Kociak
Affiliation:
Laboratoire de Physique des Solides, Bâtiment 510, CNRS UMR 8502, Université Paris Sud XI, F 91405 Orsay, France.
Javier Aizpurua
Affiliation:
Materials Physics Center, CSIC-UPV/EHU, 20018 Donostia-San Sebastián, Spain. Donostia International Physics Center DIPC, 20018 Donostia-San Sebastián, Spain.
Ondrej L. Krivanek
Affiliation:
Nion Company, 11511 NE 118th St, Kirkland, WAUSA.
*
*Corresponding author: [email protected]

Abstract

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Type
Current Trends and Challenges in Electron Energy-Loss Spectroscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 620 - 621
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Egerton, R.F., Electron Energy-Loss Spectroscopy in the Electron Microscope, 3rd edition (Springer, 2011).Google Scholar
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[5]Lovejoy, T.C., et al. , Micros. & Microanal. 24 (2018) p. 446.Google Scholar
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[11]This research was supported by the Center for Nanophase Materials Sciences, which is a Department of Energy Office of Science User Facility (J.C.I., J.A.H.). This research was conducted, in part, using instrumentation within ORNL's Materials Characterization Core provided by UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy. Research by A.K. and J.A. was supported by the Spanish Ministry of Economy, Industry and Competitiveness (national projects MAT2015-65525-R, FIS2016-80174-P, and project MDM-2016-0618 of the Maria de Maetzu Units of Excellence Programme). JGdeA acknowledges support from Spanish MINECO (MAT2017-88492-R and SEV2015-0522) and the European Research Council (Advanced Grant No. 789104-eNANO).Google Scholar