Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-25T09:26:53.116Z Has data issue: false hasContentIssue false
  • English
  • Français

EDS and VP-SEM: Practical Considerations and Challenges

Published online by Cambridge University Press:  01 August 2018

Jens Rafaelsen  and
T. Nylese
Jens Rafaelsen
Affiliation:
EDAX Inc, A Division of Ametek, Materials Analysis Division, Mahwah, NJ, USA
T. Nylese
Affiliation:
EDAX Inc, A Division of Ametek, Materials Analysis Division, Mahwah, NJ, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 684 - 685
Copyright
© Microscopy Society of America 2018 

References

[1] Danilatos, G. Adv. Electronics Electron Phys 71 1988) p. 109.Google Scholar
[2] Newbury, D. E. Journal of Research of the National Institute of Standards and Technology 107 2002) p. 567.Google Scholar
[3] Khouchaf, L. Microscopy. Research 1 2013) p. 29.Google Scholar
[4] Rattenberger, J et al, J. Scanning 31 2009) p. 107.Google Scholar
[5] Newbury, D. E. Ritchie, N. W. M. Microsc. Microanal. 23 2017) p. 1090.Google Scholar
[6] Doehne, E. Scanning 19 1997) p. 75.Google Scholar
[7] Mansfield, J. F. Microchimica Acta 132 2000) p. 137.Google Scholar
[8] Gauvin, R. Scanning 21 1999) p. 388.Google Scholar