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Dynamic Transmission Electron Microscope Study on the Crystallization of Ion-Bombarded Amorphous Germanium Thin Films

Published online by Cambridge University Press:  23 September 2015

Tian T. Li ,
Melissa K. Santala ,
Leonardus Bimo Bayu Aji ,
Sergei O. Kucheyev ,
Huai-Yu M. Cheng  and
Geoffrey H. Campbell
Tian T. Li
Affiliation:
Materials Science Division, Lawrence Livermore National Laboratory, Livermore, CA, USA
Melissa K. Santala
Affiliation:
Materials Science Division, Lawrence Livermore National Laboratory, Livermore, CA, USA
Leonardus Bimo Bayu Aji
Affiliation:
Materials Science Division, Lawrence Livermore National Laboratory, Livermore, CA, USA
Sergei O. Kucheyev
Affiliation:
Materials Science Division, Lawrence Livermore National Laboratory, Livermore, CA, USA
Huai-Yu M. Cheng
Affiliation:
IBM/Macronix PCRAM Joint Project, IBM T. J. Watson Research Center, Yorktown Heights, NY, USA
Geoffrey H. Campbell
Affiliation:
Materials Science Division, Lawrence Livermore National Laboratory, Livermore, CA, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1855 - 1856
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Haberl, B., et al, J. Appl. Phys. 110 (2011) 096104.Google Scholar
[2] Campbell, G.H., McKeown, J.T. & Santala, M.K., Appl. Phys. Rev. 1 (2014) 041101.Google Scholar
[3] This work was performed under the auspices of the U.S. Department of Energy, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering for FWP SCW0974 by Lawrence Livermore National Laboratory under Contract DE-AC52-07NA27344..Google Scholar