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DualBeam Electron Microscopy for Targeted Whole Cell Architecture

Published online by Cambridge University Press:  03 August 2008

BM Humbel ,
DAM De Winter ,
CTWM Schneijdenberg ,
B Lich  and
AJ Verkleij
BM Humbel
Affiliation:
University Utrecht, The Netherlands
DAM De Winter
Affiliation:
University Utrecht, The Netherlands
CTWM Schneijdenberg
Affiliation:
University Utrecht, The Netherlands
B Lich
Affiliation:
FEI Company, The Netherlands
AJ Verkleij
Affiliation:
University Utrecht, The Netherlands
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 970 - 971
Copyright
© 2008 Microscopy Society of America

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