Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-12-01T02:13:36.020Z Has data issue: false hasContentIssue false
  • English
  • Français

Distinguishing Isotopes in the Electron Microscope: In-situ TEM-SIMS Correlative Analysis

Published online by Cambridge University Press:  25 July 2016

Lluís Yedra ,
Santhana Eswara ,
David Dowsett  and
Tom Wirtz
Lluís Yedra
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, Belvaux, Luxembourg
Santhana Eswara
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, Belvaux, Luxembourg
David Dowsett
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, Belvaux, Luxembourg
Tom Wirtz
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, Belvaux, Luxembourg

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 222 - 223
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Egerton, R. F. “Electron Energy-Loss Spectroscopy in the Electron Microscope”, (3rd edition) , (Springer, New York) (2011).CrossRefGoogle Scholar
[2] Benninghoven, A., Werner, H. W. & Rüdenauer, F. G. “Secondary ion mass spectrometry: Basic concepts, instrumental aspects, applications and trends”. Wiley-Interscience, New York, Chichester, Brisbane, Toronto, Singapore (1987).Google Scholar
[3] Wirtz, T., et al, Nanotechnology 26, 434001 (2015).Google Scholar