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Dispersion of Ni particles on SiO2 by an improved incipient wetness method and full characterization by TEM

Published online by Cambridge University Press:  23 November 2012

C. Leyva ,
A. Aguilar-Elguezabal  and
I. Reza
C. Leyva
Affiliation:
Centro de Investigacion en Materiales Avanzados S.C. (CIMAV), Apodaca, Nuevo Leon, Mexico
A. Aguilar-Elguezabal
Affiliation:
Centro de Investigacion en Materiales Avanzados S.C. (CIMAV), Chihuahua, Chihuahua, Mexico
I. Reza
Affiliation:
Facultad de Zootecnia y Ecologia. UACH, Chihuahua, Chihuahua, Mexico
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1386 - 1387
Copyright
Copyright © Microscopy Society of America 2012

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