Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-11-03T08:19:51.279Z Has data issue: false hasContentIssue false
  • English
  • Français

Dislocation Characterization using Weak Beam Dark Field STEM Imaging

Published online by Cambridge University Press:  01 August 2018

J. Miao ,
S. Singh ,
J. Tessmer ,
M. Shih ,
M. Ghazisaeidi ,
M. DeGraef  and
M. J. Mills
J. Miao
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH. Department of Materials Science and Engineering, The Ohio State University, Columbus, OH.
S. Singh
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA.
J. Tessmer
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA.
M. Shih
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH.
M. Ghazisaeidi
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH.
M. DeGraef
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA.
M. J. Mills
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH. Department of Materials Science and Engineering, The Ohio State University, Columbus, OH.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 2202 - 2203
Copyright
© Microscopy Society of America 2018 

References

[1] Phillips, P.J., Mills, M.J. De Graef, M. Philosophical Magazine 91 2011) p. 2081.Google Scholar
[2] Cockayne, D.J.H., Ray, I. L.F. Whelan, M. J. Philosophical Magazine A 20 1969) p. 1265.Google Scholar
[3] Iwata, H. Saka, H. Philosophical Magazine Letters 97 2017) p. 74.Google Scholar
[4] Miao, J., et al, Acta Materialia 132 2017) p. 35.Google Scholar
[5] The authors acknowledge financial supports from The National Science Foundation, Division of Materials Research under contract # #DMR-60050072.Google Scholar