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Dislocation Analysis in Metal-Oxide Materials and Devices by Electron Channeling Contrast Imaging

Published online by Cambridge University Press:  23 November 2012

R. Kamaladasa ,
M. Norman ,
Y. Lu ,
J.A. Bain ,
P.A. Salvador ,
M. Skowronski ,
M. De Graef  and
Y.N. Picard
R. Kamaladasa
Affiliation:
Department of Materials Science, Carnegie Mellon Univ, Pittsburgh, PA
M. Norman
Affiliation:
Department of Materials Science, Carnegie Mellon Univ, Pittsburgh, PA
Y. Lu
Affiliation:
Department of Materials Science, Carnegie Mellon Univ, Pittsburgh, PA
J.A. Bain
Affiliation:
Department of Materials Science, Carnegie Mellon Univ, Pittsburgh, PA
P.A. Salvador
Affiliation:
Department of Materials Science, Carnegie Mellon Univ, Pittsburgh, PA
M. Skowronski
Affiliation:
Department of Materials Science, Carnegie Mellon Univ, Pittsburgh, PA
M. De Graef
Affiliation:
Department of Materials Science, Carnegie Mellon Univ, Pittsburgh, PA
Y.N. Picard
Affiliation:
Department of Materials Science, Carnegie Mellon Univ, Pittsburgh, PA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 706 - 707
Copyright
Copyright © Microscopy Society of America 2012

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