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Discrete tomography: exploiting various forms of discreteness in electron tomography

Published online by Cambridge University Press:  03 August 2008

KJ Batenburg ,
S Bals ,
J Sijbers  and
G Van Tendeloo
KJ Batenburg
Affiliation:
University of Antwerp, Belgium
S Bals
Affiliation:
University of Antwerp, Belgium
J Sijbers
Affiliation:
University of Antwerp, Belgium
G Van Tendeloo
Affiliation:
University of Antwerp, Belgium
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1050 - 1051
Copyright
© 2008 Microscopy Society of America

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