Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-26T04:44:09.892Z Has data issue: false hasContentIssue false
  • English
  • Français

Direct Observations of Retention Failure in Ferroelectric Memories by in situ Transmission Electron Microscopy

Published online by Cambridge University Press:  23 November 2012

P. Gao ,
C. Nelson ,
J. Jokisaari ,
Y. Zhang ,
X. Pan ,
S. Baek ,
C. Bark  and
C. Eom
P. Gao
Affiliation:
University of Michigan, Ann Arbor, MI
C. Nelson
Affiliation:
University of Michigan, Ann Arbor, MI
J. Jokisaari
Affiliation:
University of Michigan, Ann Arbor, MI
Y. Zhang
Affiliation:
University of Michigan, Ann Arbor, MI
X. Pan
Affiliation:
University of Michigan, Ann Arbor, MI
S. Baek
Affiliation:
University of Wisconsin-Madison, Madison, WI
C. Bark
Affiliation:
University of Wisconsin-Madison, Madison, WI
C. Eom
Affiliation:
University of Wisconsin-Madison, Madison, WI
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1846 - 1847
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)