Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-29T19:42:24.695Z Has data issue: false hasContentIssue false
  • English
  • Français

Direct Observation of Plasmonic Enhancement of Emission in Ag-nanoparticle-decorated ZnO nanostructures

Published online by Cambridge University Press:  23 September 2015

Jordan Hachtel ,
Daniel Mayo ,
Claire E. Marvinney ,
Anas Mouti ,
Richard Mu ,
Stephen J. Pennycook ,
Andrew R. Lupini ,
Matthew F. Chisholm ,
Richard F. Haglund  and
Sokrates T. Pantelides
Jordan Hachtel
Affiliation:
Vanderbilt University, Department of Physics and Astronomy, Nashville, TN USA Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge, TN USA
Daniel Mayo
Affiliation:
Vanderbilt University, Interdisciplinary Materials Science Program, Nashville TN, USA Fisk University, Department of Physics and Astronomy, Nashville, TN USA
Claire E. Marvinney
Affiliation:
Vanderbilt University, Interdisciplinary Materials Science Program, Nashville TN, USA
Anas Mouti
Affiliation:
Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge, TN USA
Richard Mu
Affiliation:
Fisk University, Department of Physics and Astronomy, Nashville, TN USA
Stephen J. Pennycook
Affiliation:
National University of Singapore, Department of Materials Science and Engineering, Singapore
Andrew R. Lupini
Affiliation:
Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge, TN USA
Matthew F. Chisholm
Affiliation:
Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge, TN USA
Richard F. Haglund
Affiliation:
Vanderbilt University, Department of Physics and Astronomy, Nashville, TN USA Vanderbilt University, Interdisciplinary Materials Science Program, Nashville TN, USA
Sokrates T. Pantelides
Affiliation:
Vanderbilt University, Department of Physics and Astronomy, Nashville, TN USA Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge, TN USA Vanderbilt University, Department of Electrical Engineering and Computer Science, Nashville, TN USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2389 - 2390
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Jain, P. K., Eustis, S. & El-Sayed, M.A., J. Phys. Chem. B 110 (2006) 18243.Google Scholar
[2] Manjavacas, A., de Abajo, F. J. G. & Nordlander, P., Nano Lett. 11 (2011) 2318.CrossRefGoogle Scholar
[3] Mayo, D. C., et al, Thin Solid Films 553 (2014) 132.CrossRefGoogle Scholar
[4] This work was funded by NSF-EPS-1004083, NSF-TN-SCORE, DOD-W911NF-11-1-0156, DOD-W911NF-13-1-0153, DE-FG02-09ER46554, DE-FG02-01ER45916, and the DOE Office of Science BES Materials Science and Engineering Division..Google Scholar