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Direct Observation of Metallic Thin Layers Dewetting By HT-ESEM

Published online by Cambridge University Press:  07 February 2019

P. Jacquet ,
B. Song ,
R. Podor ,
J. Lautru ,
E. Ruiz Trejo ,
S. J. Cooper ,
J. Teisseire ,
I. Gozhyk ,
J. Jupille  and
R. Lazzari
P. Jacquet
Affiliation:
Surface du Verre et Interfaces, UMR 125 CNRS/Saint-Gobain Recherche, 39 quai Lucien Lefranc, F-93303 Aubervilliers, France. CNRS, UMR 7588, Institut des NanoSciences de Paris, 4 place Jussieu, F-75005 Paris, France. Sorbonne Universités, UPMC Univ Paris 06, UMR 7588, Institut des NanoSciences de Paris, 4 place Jussieu, F-75005 Paris, France.
B. Song
Affiliation:
CNRS, UMR 7588, Institut des NanoSciences de Paris, 4 place Jussieu, F-75005 Paris, France.
R. Podor
Affiliation:
ICSM, CEA, CNRS, ENSCM, Univ Montpellier, Marcoule, France.
J. Lautru
Affiliation:
ICSM, CEA, CNRS, ENSCM, Univ Montpellier, Marcoule, France.
E. Ruiz Trejo
Affiliation:
Department of Earth Science and Engineering, Imperial College London, United Kingdom
S. J. Cooper
Affiliation:
Dyson School of Design Engineering, Imperial College London, London, SW7 1NA, UK.
J. Teisseire
Affiliation:
Surface du Verre et Interfaces, UMR 125 CNRS/Saint-Gobain Recherche, 39 quai Lucien Lefranc, F-93303 Aubervilliers, France.
I. Gozhyk
Affiliation:
Surface du Verre et Interfaces, UMR 125 CNRS/Saint-Gobain Recherche, 39 quai Lucien Lefranc, F-93303 Aubervilliers, France.
J. Jupille
Affiliation:
CNRS, UMR 7588, Institut des NanoSciences de Paris, 4 place Jussieu, F-75005 Paris, France. Sorbonne Universités, UPMC Univ Paris 06, UMR 7588, Institut des NanoSciences de Paris, 4 place Jussieu, F-75005 Paris, France.
R. Lazzari
Affiliation:
CNRS, UMR 7588, Institut des NanoSciences de Paris, 4 place Jussieu, F-75005 Paris, France. Sorbonne Universités, UPMC Univ Paris 06, UMR 7588, Institut des NanoSciences de Paris, 4 place Jussieu, F-75005 Paris, France.

Abstract

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Type
Materials Science (Posters)
Information
Microscopy and Microanalysis , Volume 25 , Issue S1: Proceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy , February 2019 , pp. 69 - 70
Copyright
Copyright © Microscopy Society of America 2019 

References

References:

[1]Leroy, F et al. , Surf Sci Rep 71 (2016), p. 391.Google Scholar
[2]Jacquet, P et al. , Scr Mater 115 (2016), p. 128.Google Scholar
[4]Jacquet, P et al. , Acta Materialia 143 (2018), p. 281.Google Scholar