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Direct Observation of Changes of the Metal-Substrate Interface Chemistry in Supported Heterogeneous Catalysts

Published online by Cambridge University Press:  02 July 2020

R.F. Klie
Affiliation:
Department of Physics (M/C 273), University of Illinois at Chicago, 845 West Taylor Street, Chicago, IL, 60607-7059
N.D. Browning
Affiliation:
Department of Physics (M/C 273), University of Illinois at Chicago, 845 West Taylor Street, Chicago, IL, 60607-7059
M.M. Disko
Affiliation:
ExxonMobil Research and Eng. Co., Corporate Strategic Research, Annandale, NJ, 08801
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Abstract

The heterogeneous catalytic system Pt/SiO2 is widely used in “three-way” catalysts, because of its highly selective catalytic reduction of NO by hydrocarbons at low operating temperatures. Although used effectively for more than a decade, in recent years it has become clear that the core phenomena of heterogeneous catalysis can occur at interfaces. in the work presented here, we seek to better understand the role of the atomic and electronic structure of interfaces in making particular reactions facile and moderating the stability and selectivity of a catalytic system.

We investigate model supported platinum catalysts by atomic resolution Z-contrast imaging and EELS using a 200 kV STEM/TEM JEOL2010F with a post column GIF. The combination of these techniques allows us to obtain direct images of the metal particle and its interface with the supporting SiO2, and to correlate that with the modulation of the Si L-edge fine structure.

Type
Characterization of Catalysts (Organized by S. Bradley)
Copyright
Copyright © Microscopy Society of America 2001

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References

references

1.Thomas, J. M. and Thomas, W. J., “Principles and Practice of Heterogeneous Catalysis” (VCH Publishers, New York, 1997), p. 11.Google Scholar
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4. This work is supported by ExxonMobil. The JEOL 2010F microscope was purchased with support from the National Science Foundation (NSF-DMR-9601792), and is operated by the Research Resources Center at the University of Illinois at Chicago.Google Scholar