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Direct Mapping of Confined Interfacial States in Oxides Using Aberration Corrected STEM and EELS

Published online by Cambridge University Press:  01 August 2010

AB Shah ,
JM Zuo ,
QM Ramasse ,
JG Wen ,
X Zhai ,
A. Bhattacharya  and
JN Eckstein
AB Shah
Affiliation:
University of Illinois at Urbana-Champaign
JM Zuo
Affiliation:
University of Illinois at Urbana-Champaign
QM Ramasse
Affiliation:
Lawrence-Berkeley National Laboratory
JG Wen
Affiliation:
University of Illinois at Urbana-Champaign
X Zhai
Affiliation:
University of Illinois at Urbana-Champaign
A. Bhattacharya
Affiliation:
Argonne National Laboratory
JN Eckstein
Affiliation:
University of Illinois at Urbana-Champaign

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1394 - 1395
Copyright
Copyright © Microscopy Society of America 2010