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Direct Imaging of Point Defect Configurations for Au inside Si Nanowires

Published online by Cambridge University Press:  03 August 2008

K van Benthem ,
S-H Oh ,
AY Borisevich ,
W Luo ,
P Werner ,
ND Zakharov ,
ST Pantelides  and
SJ Pennycook
K van Benthem
Affiliation:
Oak Ridge National Laboratory
S-H Oh
Affiliation:
Oak Ridge National Laboratory
AY Borisevich
Affiliation:
Oak Ridge National Laboratory
W Luo
Affiliation:
Vanderbilt University
P Werner
Affiliation:
Max Planck Institut of Microstructure Physics, Germany
ND Zakharov
Affiliation:
Max Planck Institut of Microstructure Physics, Germany
ST Pantelides
Affiliation:
Oak Ridge National Laboratory
SJ Pennycook
Affiliation:
Oak Ridge National Laboratory
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 204 - 205
Copyright
© 2008 Microscopy Society of America

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