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Direct Imaging of Dopant-Elements Distributions in High-Strength Nanostructured Materials by Atomic-Resolution Z-Contrast STEM

Published online by Cambridge University Press:  01 August 2005

E Abe
E Abe
Affiliation:
National Institute for Materials Science,Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1454 - 1455
Copyright
© 2005 Microscopy Society of America