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Digital Camera System in Transmission Electron Microscope

Published online by Cambridge University Press:  05 August 2019

Cheolsu Han ,
Jong-Man Jeung ,
Jin-Gyu Kim  and
Sang-Chul Lee
Cheolsu Han*
Affiliation:
Korea Basic Science Institute, Daejeon, Republic of Korea.
Jong-Man Jeung
Affiliation:
Korea Basic Science Institute, Daejeon, Republic of Korea.
Jin-Gyu Kim
Affiliation:
Korea Basic Science Institute, Daejeon, Republic of Korea.
Sang-Chul Lee
Affiliation:
Korea Basic Science Institute, Daejeon, Republic of Korea.
*
*Corresponding author: [email protected]

Abstract

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Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 546 - 547
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Williams, DB et al. , in “Transmission Electron Microscopy: A Textbook for Materials Science”, (Springer) Ch.7.Google Scholar
[2]Fan, GY and Ellisman, MH, Journal of Microscopy 200 (2000), p. 1.Google Scholar
[3]Vulovic, M et al. , Cryst., D66 (2010), p. 97.Google Scholar
[4]This research was supported by Korea Basic Science Institute Grant No.(D39612).Google Scholar