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Diffractive X-ray Optics for Synchrotrons and Free-Electron Lasers

Published online by Cambridge University Press:  10 August 2018

Christian David ,
Benedikt Rösner ,
Florian Döring ,
Vitaliy Guzenko ,
Frieder Koch ,
Maxime Lebugle ,
Felix Marschall ,
Gediminas Seniutinas ,
Jörg Raabe  and
Benjamin Watts
...Show all authors
Christian David*
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Benedikt Rösner
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Florian Döring
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Vitaliy Guzenko
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Frieder Koch
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Maxime Lebugle
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Felix Marschall
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Gediminas Seniutinas
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Jörg Raabe
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Benjamin Watts
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Daniel Grolimund
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Zhong Yin
Affiliation:
Georg-August Universität Göttingen, 37077Göttingen, Germany Deutsches Elektronen Synchrotron, D-22607Hamburg, Germany
Martin Beye
Affiliation:
Deutsches Elektronen Synchrotron, D-22607Hamburg, Germany
Simone Techert
Affiliation:
Georg-August Universität Göttingen, 37077Göttingen, Germany Deutsches Elektronen Synchrotron, D-22607Hamburg, Germany Max Planck Institute for Biophysical Chemistry, 37077Göttingen, Germany
Jens Viefhaus
Affiliation:
Deutsches Elektronen Synchrotron, D-22607Hamburg, Germany
Gerald Falkenberg
Affiliation:
Deutsches Elektronen Synchrotron, D-22607Hamburg, Germany
Christian Schroer
Affiliation:
Deutsches Elektronen Synchrotron, D-22607Hamburg, Germany
*
*Corresponding author, [email protected]

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 264 - 267
Copyright
© Microscopy Society of America 2018 

References

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