No CrossRef data available.
Published online by Cambridge University Press: 02 July 2020
The pivotal role played by Archie Howie in the development of many areas of electron microscopy is universary acknowledged.Here I would like to highlight his contribution to the quantitative description of secondary excitations, which was an important influence on the development of Z-contrast imaging in zone-axis crystals. Secondary excitations are those such as x-ray emission which occur following a primary scattering event, in this case excitation of inner shell electrons. The first important concept to be realized by Archie was that dynamical diffraction and channeling are different manifestations of the same physical effect, namely, the multiple scattering of electrons within a crystal. Second was the realization that processes which are localized within the unit cell will show a dependence on diffraction conditions, such as incident beam orientation, and could therefore be described quantitatively using dynamical diffraction theory. Precisely the same theory was used to describe the orientation dependence of cathodoluminescence
The development of the STEM for high resolution imaging was of course due primarily to Crewe and coworkers, with an annular detector to allow efficient detection of elastic scattering over a wide angular range.
1 Howie, A., Phil. Mag. 14, 223 (1967)CrossRefGoogle Scholar
2 Cherns, D., Howie, A., and Jacobs, M.H., Ultramicroscopy 21, 277 (1987)Google Scholar
3 Pennycook, S.J. and Howie, A., Philos. Mag. 41, 809 (1980)CrossRefGoogle Scholar
4 Crewe, A.V., Wall, J.and Langmore, J., Science 168, 1338 (1970)CrossRefGoogle Scholar
5 Isaacson, M.S., Ohtsuki, M., and Utlaut, M., in: Introduction to Analytical Electron Microscopy, (Plenum, New York, 1979), p. 343CrossRefGoogle Scholar
6 Donald, A.M.and Brown, L.M., Acta Met. 27, 59 (1979)CrossRefGoogle Scholar
7 Treacy, M.M.J., Howie, A., and Wilson, C.J., Phil. Mag. 38, 569 (1978)CrossRefGoogle Scholar
8 Howie, A., J. Microsc. 117, 11 (1979).CrossRefGoogle Scholar
9 Treacy, M.M.J., Howie, A., and Pennycook, S.J., in Electron Microscopy and Analysis, 1979, (Inst. Phys. Conf. Ser. No. 52, Institute of Physics, London and Bristol, 1980) p. 261Google Scholar
10 Ade, G., Optik 49, 113(1977)Google Scholar
11 Engel, A., Wiggins, J.W., and Woodruff, D.C., J. Appl. Phys. 45, 2739 (1974)CrossRefGoogle Scholar
12 Lord, Rayleigh, Phil. Mag. (5) 42, 167 (1896)Google Scholar
13 Cowley, J.M., in Principles of Analytical Electron Microscopy, (Plenum Press, New York, 1986), p. 343Google Scholar
14 Pennycook, S.J., Berger, S.D., and Culbertson, R.J., J. Microsc. 144, 229 (1986)CrossRefGoogle Scholar
15 Pennycook, S.J. and Boatner, L.A., Nature 336, 565 (1988)CrossRefGoogle Scholar
16 Pennycook, S.J. and Jesson, D.E., Phys. Rev. Lett. 64, 938 (1990)CrossRefGoogle Scholar
17 Loane, R.F., Xu, P., and Silcox, J., Ultramicroscopy 40, 121 (1992)CrossRefGoogle Scholar
18 Nellist, P.D., and Pennycook, S.J., Ultramicroscopy, in pressGoogle Scholar
19 Nellist, P.D., and Pennycook, S.J., J. Microscopy 190, 159 (1998)CrossRefGoogle Scholar
20 Pennycook, S.J., et al., Handbook of Microscopy, (VCH Publishers, Weinheim, Germany, 1997), p. 595Google Scholar
21 Duscher, G., Browning, N.D., and Pennycook, S.J., Phys. Stat. Sol. (a) 166, 327 (1998)3.0.CO;2-R>CrossRefGoogle Scholar
22 Ritchie, R.H. and Howie, A., Phil. Mag. A 58, 753–767 (1988).CrossRefGoogle Scholar
23 Nellist, P.D. and Pennycook, S.J., Phys. Rev. Lett. 81, 4156 (1998)CrossRefGoogle Scholar
24 Krivanek, O.L., Dellby, N. and Lupini, A.R., these proceedings. This research was sponsored by the Division of Materials Sciences, U.S. Department of Energy, under contract DE-AC05-96OR22464 with Lockheed Martin Energy Research CorpGoogle Scholar