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Differentiation of Surface and Bulk Conductivities via Four-probe Spectroscopy

Published online by Cambridge University Press:  25 July 2016

Saban M. Hus
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
Corentin Durand
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
X.-G. Zhang
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA Department of Physics, University of Florida, Gainesville, FL 32611, USA
Chuanxu Ma
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
Michael A. McGuire
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
Yang Xu
Affiliation:
Department of Physics and Astronomy, Purdue University, West Lafayette, IN 47907, USA
Helin Cao
Affiliation:
Department of Physics and Astronomy, Purdue University, West Lafayette, IN 47907, USA
Ireneusz Miotkowski
Affiliation:
Department of Physics and Astronomy, Purdue University, West Lafayette, IN 47907, USA
Yong P. Chen
Affiliation:
Department of Physics and Astronomy, Purdue University, West Lafayette, IN 47907, USA
An-Ping Li
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

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[8] This research was conducted at the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility. MAM acknowledges support from the DOE Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division. The Bi2Te2Se crystal growth and characterization at Purdue was supported by DARPA MESO program (Grant N66001-11-1-4107).Google Scholar