Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-24T09:03:30.638Z Has data issue: false hasContentIssue false
  • English
  • Français

Differential Potential Distribution Observation in Transmission Electron Microscope with Conventional Thermal Electron Gun

Published online by Cambridge University Press:  01 August 2018

Katsuhiro Sasaki ,
Hirokazu Sasaki  and
Sohei Saito
Katsuhiro Sasaki
Affiliation:
Chemical Analysis Research Section, R&D Division, UACJ Company, Nagoya, Japan
Hirokazu Sasaki
Affiliation:
Advanced Technologies R&D Laboratories, Furukawa Electric Co. Ltd., Yokohama, Japan
Sohei Saito
Affiliation:
Chemical Analysis Research Section, R&D Division, UACJ Company, Nagoya, Japan

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 26 - 27
Copyright
© Microscopy Society of America 2018 

References

[1] Tonomura, A. Reviews of Modern Physics 59 1987) p. 639.Google Scholar
[2] Chapman, J. N. J. Phys. D 17 1984) p. 623.Google Scholar
[3] Shabata, N., et al, Scientific Reports 5 2015) p. 10040.Google Scholar
[4] Sasaki, K. Saka, H. Materials Science Forum 475-479 2005) p. 4029.Google Scholar
[5] Sasaki, K., et al in The Transmission Electron. Microscope (ed. M. Khan InTech Rijeka p. 1.Google Scholar
[6] Sasaki, H., et al, Microscopy 63 2014) p. 235.Google Scholar
[7] Takahashi, H., et al, Proc. 16th Int. Microscopy Congress 2006) p. 1104.Google Scholar
[8] The authors thank to Dr. Y Hori for his SIMS and electron holography measurements.Google Scholar