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Differential Microscopy by Electron Holography With an Electron Trapezoidal Prism

Published online by Cambridge University Press:  02 July 2020

T. Tanji  and
S. Manabe
T. Tanji
Affiliation:
CIRSE, Nagoya University, Chikusa, Nagoya464-01, Japan
S. Manabe
Affiliation:
CIRSE, Nagoya University, Chikusa, Nagoya464-01, Japan
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Extract

Electron holography has been successfully used in the observation of phase objects such as magnetic fields and electrostatic potentials. Electron holograms are constructed by the interference of a modulated object wave and a well-defined reference wave and in most cases the reference wave is required to be a plane wave. Frequently, however, the magnetic or electric field extends beyond the interference region, resulting in a distorted reference wave. The reconstructed wave from a hologram made with a distorted reference wave does not accurately express the object wave but the difference from the reference wave.

Differential interferometry is a useful technique in the absence of a well-defined reference wave. Some electron holography techniques using two-beam illumination for differential interferometry have been proposed. We have also proposed a new technique for differential microscopy by conventional electron off-axis holography, which utilizes an electron biprism to shear the object wave. Shearing of the object wave is essential for differential interferometry.

Type
Recent Developments in Microscopy for Studying Electronic and Magnetic Materials
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 515 - 516
Copyright
Copyright © Microscopy Society of America 1997

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