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Differences in Structural and Electronic Properties of Conducting LGO/STO and LAO/STO Interfaces

Published online by Cambridge University Press:  08 April 2017

C Cantoni
Affiliation:
Oak Ridge National Laboratory
J Gazquez
Affiliation:
Oak Ridge National Laboratory
M Oxley
Affiliation:
Oak Ridge National Laboratory
A Lupini
Affiliation:
Oak Ridge National Laboratory
M Varela
Affiliation:
Oak Ridge National Laboratory
S Pennycook
Affiliation:
Oak Ridge National Laboratory
P Perna
Affiliation:
CNR-SPIN Università di Napoli Federico II, Italy
D Marre
Affiliation:
CNR-SPIN Università di Genova, Italy
C Aruta
Affiliation:
CNR-SPIN Università di Napoli Federico II, Italy
U Scotti di Uccio
Affiliation:
CNR-SPIN Università di Napoli Federico II, Italy
F Miletto Granozio
Affiliation:
CNR-SPIN Università di Napoli Federico II, Italy

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2011