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Development of RF-compressed High-throughput Femtosecond Electron Microscope

Published online by Cambridge University Press:  30 July 2020

Shuaishuai Sun ,
Xiaoyi Sun ,
Joseph Williams  and
Chong-Yu Ruan
Shuaishuai Sun
Affiliation:
Michigan State University, East Lansing, Michigan, United States
Xiaoyi Sun
Affiliation:
Michigan State University, East Lansing, Michigan, United States
Joseph Williams
Affiliation:
Michigan State University, East Lansing, Michigan, United States
Chong-Yu Ruan
Affiliation:
Michigan State University, East Lansing, Michigan, United States

Abstract

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Type
Electron Pulses as an Ultrafast Probe for Non-Equilibrium Processes
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 430 - 433
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Copyright
Copyright © Microscopy Society of America 2020

References

Miller, R. J. D., Science 343, 1108 (2014).10.1126/science.1248488CrossRefGoogle Scholar
Zewail, A. H., Science 328, 187 (2010).10.1126/science.1166135CrossRefGoogle Scholar
Konstantinova, T., Wu, L., Abeykoon, M., et al. , Phys. Rev. B 99, 180102(R) (2019).10.1103/PhysRevB.99.180102CrossRefGoogle Scholar
van Oudheusden, T., Pasmans, P. L. E. M., van der Geer, S. B., et al. , Phys. Rev. Lett. 105, 264801 (2010).10.1103/PhysRevLett.105.264801CrossRefGoogle Scholar
Williams, J., Zhou, F., Sun, T., et al. , Struct. Dyn. 4, 044035 (2017).10.1063/1.4999456CrossRefGoogle Scholar
Zhou, F., Williams, J., and Ruan, C.-Y., Chem. Phys. Lett. 683, 488 (2017).10.1016/j.cplett.2017.03.019CrossRefGoogle Scholar
Tao, Z., Han, T.-R. T., Mahanti, S. D., et al. , Phys. Rev. Lett. 109, 166406 (2012).10.1103/PhysRevLett.109.166406CrossRefGoogle Scholar
Goerlitzer, E. S. A., Speichermann, L. E., Mirza, T. A., et al. , Nanoscale Adv. 2, 394 (2020)10.1039/C9NA00757ACrossRefGoogle Scholar