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Development of Real-Time Probe Current Calibration for Performing Quantitative STEM with a Cold Field-Emission Gun.

Published online by Cambridge University Press:  25 July 2016

Stephen D. House ,
C.T. Schamp ,
Russell Henry ,
Dong Su ,
Eric Stach  and
Judith C. Yang
Stephen D. House
Affiliation:
Dept. of Chemical and Petroleum Engineering, University of Pittsburgh, Pittsburgh, PA(USA)
C.T. Schamp
Affiliation:
Hitachi High Technologies America, Inc., Dallas, TX(USA)
Russell Henry
Affiliation:
Hitachi High Technologies America, Inc., Dallas, TX(USA)
Dong Su
Affiliation:
Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY(USA)
Eric Stach
Affiliation:
Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY(USA)
Judith C. Yang
Affiliation:
Dept. of Chemical and Petroleum Engineering, University of Pittsburgh, Pittsburgh, PA(USA)

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 940 - 941
Copyright
© Microscopy Society of America 2016 

References

References:

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[2] LeBeau, JM, et al., Physical Review Letters 100 (2008). p. 20601.CrossRefGoogle Scholar
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[5] ■, H E, et al., Ultramicroscopy 133 (2013). p. 109–119.Google Scholar
[6] This work was supported by DOE BES through grant DE FG02-03ER15476, and performed using the facilities at the Center for Functional Nanomaterials at Brookhaven National Laboratory, which is supported by DOE BES through contract DE-SC0012704.Google Scholar