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Development of Pulse Magnetization System on Aberration Corrected 1.2-MV Cold Field-Emission Transmission Electron Microscope

Published online by Cambridge University Press:  25 July 2016

Toshiaki Tanigaki ,
Tetsuya Akashi ,
Akira Sugawara ,
Kodai Niitsu ,
Xiuzhen Yu ,
Yasuhide Tomioka ,
Daisuke Shindo ,
Yoshinori Tokura  and
Hiroyuki Shinada
Toshiaki Tanigaki
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama 350-0395, Japan
Tetsuya Akashi
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama 350-0395, Japan
Akira Sugawara
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama 350-0395, Japan
Kodai Niitsu
Affiliation:
Center for Emergent Matter Science (CEMS), RIKEN, Wako 351-0198, Japan
Xiuzhen Yu
Affiliation:
Center for Emergent Matter Science (CEMS), RIKEN, Wako 351-0198, Japan
Yasuhide Tomioka
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8568, Japan
Daisuke Shindo
Affiliation:
Center for Emergent Matter Science (CEMS), RIKEN, Wako 351-0198, Japan Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan
Yoshinori Tokura
Affiliation:
Center for Emergent Matter Science (CEMS), RIKEN, Wako 351-0198, Japan Department of Applied Physics and Quantum-Phase Electron Center (QPEC), University of Tokyo, Tokyo 113-8656, Japan
Hiroyuki Shinada
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama 350-0395, Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1702 - 1703
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Akashi, T, et al, Appl. Phys. Lett 106 (2015). p. 074101.Google Scholar
[2] Takahashi, Y., et al., Microsc. Microanal 21(Suppl 3 (2015). p. 1865.Google Scholar
[3] Suzuki, T., et al., Ultramicroscopy 118 (2012). p. 21.Google Scholar
[4] Murakami, Y., et al., Nature Commnications 5 (2014). p. 4133.Google Scholar