Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-29T01:01:21.517Z Has data issue: false hasContentIssue false
  • English
  • Français

Developing a Programmable STEM Detector for the Scanning Electron Microscope

Published online by Cambridge University Press:  01 August 2018

Benjamin W. Caplins ,
Jason D. Holm  and
Robert R. Keller
Benjamin W. Caplins
Affiliation:
Applied Chemicals and Materials Division, National Institute of Standards and Technology, Boulder, CO, United States.
Jason D. Holm
Affiliation:
Applied Chemicals and Materials Division, National Institute of Standards and Technology, Boulder, CO, United States.
Robert R. Keller
Affiliation:
Applied Chemicals and Materials Division, National Institute of Standards and Technology, Boulder, CO, United States.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 658 - 659
Copyright
© Microscopy Society of America 2018 

References

[1] Jacobson, B, et al, Proceedings of SPIE 2015) p. 93760K.Google Scholar
[2] This work is a contribution of the US Government and is not subject to United States copyright.Google Scholar