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Determining the chemical elements present in soybean leaves infected with Asian Soybean Rust employing X-ray fluorescence by SEM

Published online by Cambridge University Press:  23 November 2012

P.A. Aragao ,
C. Andrade ,
J.C. Spadotto  and
A.N. Rodrigues
P.A. Aragao
Affiliation:
Física Nuclear Aplicada, Universidade Estadual de Londrina (UEL), Londrina - Parana, Londrina - Parana, Brazil
C. Andrade
Affiliation:
Física Nuclear Aplicada, Universidade Estadual de Londrina (UEL), Londrina - Parana, Londrina - Parana, Brazil
J.C. Spadotto
Affiliation:
Física Nuclear Aplicada, Universidade Estadual de Londrina (UEL), Londrina - Parana, Londrina - Parana, Brazil
A.N. Rodrigues
Affiliation:
Física Nuclear Aplicada, Universidade Estadual de Londrina (UEL), Londrina - Parana, Londrina - Parana, Brazil
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1452 - 1453
Copyright
Copyright © Microscopy Society of America 2012

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