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Determination of the Effective EDS Detector Area Using Experimental and Theoretical X-ray Emission Yields

Published online by Cambridge University Press:  23 September 2015

Mathias Procop
Affiliation:
BAM Federal Institute for Materials Research and Testing, Division 6.8 Surface Analysis and Interfacial Chemistry, Berlin, Germany present address: IfG-Institute for Scientific Instruments, 12489 Berlin, Germany
Vasile-Dan Hodoroaba
Affiliation:
BAM Federal Institute for Materials Research and Testing, Division 6.8 Surface Analysis and Interfacial Chemistry, Berlin, Germany
Ralf Terborg
Affiliation:
Bruker Nano GmbH, 12489 Berlin, Germany

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

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