Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-07T23:07:33.605Z Has data issue: false hasContentIssue false
  • English
  • Français

Determination of Projected Potential Profiles Across Interfaces Using Through Focal Series Reconstruction

Published online by Cambridge University Press:  31 July 2006

S Bhattacharyya ,
CT Koch  and
M Rühle
S Bhattacharyya
Affiliation:
Max-Planck-Institut für Metallforschung,Germany
CT Koch
Affiliation:
Max-Planck-Institut für Metallforschung,Germany
M Rühle
Affiliation:
Max-Planck-Institut für Metallforschung,Germany

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1016 - 1017
Copyright
© 2006 Microscopy Society of America