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Determination Of Coherency Strains Around Particles In Ni-Al Alloys By HREM And CBED

Published online by Cambridge University Press:  02 July 2020

H. A. Calderon ,
J.J. Cruz ,
L. Calzado ,
C. Kisielowski ,
Y.C. Wang  and
R. Kilaas
H. A. Calderon
Affiliation:
Institute Politecnico Nacional, Dept. Ciencia de Mats. Apdo, Postal 75-707., MexicoD.F07300
J.J. Cruz
Affiliation:
Institute Politecnico Nacional, Dept. Ciencia de Mats. Apdo, Postal 75-707., MexicoD.F07300
L. Calzado
Affiliation:
Institute Politecnico Nacional, Dept. Ciencia de Mats. Apdo, Postal 75-707., MexicoD.F07300
C. Kisielowski
Affiliation:
National Center for Electron Microscopy, LBNL, Berkeley, CA94720, USA
Y.C. Wang
Affiliation:
National Center for Electron Microscopy, LBNL, Berkeley, CA94720, USA
R. Kilaas
Affiliation:
National Center for Electron Microscopy, LBNL, Berkeley, CA94720, USA
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Extract

Quantitative evaluation of coherency strains in Ni-12 at.% Al alloys has been performed by means of high resolution electron microscopy (HREM) and convergent beam electron diffraction (CBED) techniques. The alloy Ni-12 at.%Al is composed of two phases, the disordered fee Ni-Al solid solution and the coherent Ni3Al (γ') particles with an LI2 structure. The presence of γ' particles can impart excellent mechanical properties to these alloys. However these particles coarsen if subject to high temperature with an important reduction of mechanical properties. Coarsening of coherent particles in solid alloys is driven by the decrease of surface and elastic energies. The effect of surface energy is well understood but that of the elastic energy still requires experimental investigation. The source of elastic interaction between particles is the lattice parameter mismatch between particles and matrix. Evaluation of the elastic strain fields around particles can give some insight into the elastic interaction between particles and thus into the coarsening mechanism from an experimental viewpoint.

Type
High Resolution Electron Microscopy
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 178 - 179
Copyright
Copyright © Microscopy Society of America

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References

References.

1.)Kisielowski, C., Schmidt, O., J. Yang, Mat. Res. Soc. Symp., 482 (1998)CrossRefGoogle Scholar