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The Detectors Response of an EDS Spectrometer in Low Energy Spectrum Part

Published online by Cambridge University Press:  30 July 2020

Frank Eggert ,
Ulrich Gernert ,
Felix Reinauer  and
Patrick Camus
Frank Eggert
Affiliation:
AMETEK / EDAX, Mahwah, New Jersey, United States
Ulrich Gernert
Affiliation:
Technische Universität Berlin, Berlin, Berlin, Germany
Felix Reinauer
Affiliation:
AMETEK, Mahwah, New Jersey, United States
Patrick Camus
Affiliation:
AMETEK, Mahwah, New Jersey, United States

Abstract

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Type
Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1552 - 1553
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Copyright
Copyright © Microscopy Society of America 2020

References

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Eggert, F, Camus, P P, Reinauer, F, “Very Low Energy Peak Shifts in EDS Spectra”, Proceedings EMAS, Trondheim (2019) to be published10.1088/1757-899X/891/1/012011CrossRefGoogle Scholar
Gernert, U, Berger, D, “Specifics in EDS spectrum reconstruction at lowest X-ray energies”, Poster Microscopy Conference, Berlin (2019)Google Scholar
Eggert, F, X-Ray Spectrom. 19 (1990) 9710.1002/xrs.1300190304CrossRefGoogle Scholar