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Detection Limits for Imaging Chiral Magnetic Materials with 4-Dimensional Lorentz Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  22 July 2022

Xiyue S. Zhang ,
Kayla X. Nguyen ,
Emrah Turgut ,
Zhen Chen ,
Celesta S. Chang ,
Yu-Tsun Shao ,
Gregory D. Fuchs  and
David A. Muller
Xiyue S. Zhang
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Kayla X. Nguyen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Department of Materials Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL, USA
Emrah Turgut
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Taiwan Semiconductor Manufacturing Company, San Jose, CA, USA
Zhen Chen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Celesta S. Chang
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Yu-Tsun Shao
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Gregory D. Fuchs
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY, USA
David A. Muller*
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Quantum Materials Under Electron Beam: From Atomic Structures to Working Devices
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 1698 - 1700
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Copyright
Copyright © Microscopy Society of America 2022

References

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Funding from the National Science Foundation (DMR-1719875, DMR-2039380), DARPA (D18AC00009) and Department of Energy (DE-SC0012245).Google Scholar