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Detecting Structural and Bonding Changes in EELS Near-Edge Structures with a Monochromated TEM

Published online by Cambridge University Press:  01 August 2004

G.A. Botton ,
M.-Y. Wu ,
C. Maunders ,
J. Etheridge  and
H.J. Whitfield
G.A. Botton
Affiliation:
McMaster University, Hamilton, Ontario, Canada Delft University of Technology, Delft, The Netherlands
M.-Y. Wu
Affiliation:
Delft University of Technology, Delft, The Netherlands
C. Maunders
Affiliation:
Monash University, Victoria, Australia
J. Etheridge
Affiliation:
Monash University, Victoria, Australia
H.J. Whitfield
Affiliation:
Monash University, Victoria, Australia
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 86 - 87
Copyright
© 2004 Microscopy Society of America

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