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Depth-Resolution Imaging of Crystalline Nano Clusters on/in Amorphous Films Using Aberration-Corrected TEM

Published online by Cambridge University Press:  23 September 2015

Jun Yamasaki ,
Akihiko Hirata ,
Yoshihiko Hirotsu ,
Kaori Hirahara  and
Nobuo Tanaka
Jun Yamasaki
Affiliation:
Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, Ibaraki, Osaka, Japan.
Akihiko Hirata
Affiliation:
Advanced Institute for Materials Research, Tohoku University, Sendai, Japan.
Yoshihiko Hirotsu
Affiliation:
Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka, Japan.
Kaori Hirahara
Affiliation:
Department of Mechanical Engineering, Osaka University, Suita, Osaka, Japan.
Nobuo Tanaka
Affiliation:
EcoTopia Science Institute, Nagoya University, Nagoya, Japan.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1135 - 1136
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Tanaka, N., Yamasaki, J., et al., Nanotechnology 15 (2004) 1779–1784.CrossRefGoogle Scholar
[2] Hirahara, K., et al., Nano Lett. 6 (2006) 1778–1783.CrossRefGoogle Scholar
[3] Yamasaki, J., et al., Ultramicroscopy (2014). doi: 10.1016/j.ultramic.2014.11.005.Google Scholar
[4] This study was partly supported by Grant-in-Aids for Scientific Research on Priority Areas "Materials Science of Bulk Metallic Glasses" (No.18029011) by MEXT and on Innovative Areas "3D active site science" (No.26105001) by JSPS.Google Scholar