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Depth Sensitivity of Cs-Corrected TEM Imaging

Published online by Cambridge University Press:  05 August 2007

K Hirahara ,
J Yamasaki ,
K Saitoh  and
N Tanaka
K Hirahara
Affiliation:
Osaka University,Japan
J Yamasaki
Affiliation:
Nagoya University,Japan
K Saitoh
Affiliation:
Nagoya University,Japan
N Tanaka
Affiliation:
Nagoya University,Japan
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 890 - 891
Copyright
© 2007 Microscopy Society of America

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