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Depth Dependence of the Spatial Resolution in Scanning Transmission Electron Microscopy Experiments

Published online by Cambridge University Press:  25 July 2016

Andreas Verch
Affiliation:
INM - Leibniz Institute for New Materials, Campus D2 2, 66123 Saarbrucken, Germany
Niels de Jonge
Affiliation:
INM - Leibniz Institute for New Materials, Campus D2 2, 66123 Saarbrucken, Germany Department of Physics, University of Saarland, Campus A5 1, 66123 Saarbrucken, Germany

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Demers, H, etal, Microsc Microanal 18 (2012). p. 582.CrossRefGoogle Scholar
[2] Schuh, T & de Jonge, N C R Phys 15 (2014). p. 214.CrossRefGoogle Scholar
[3] We thank E. Arzt for his support through INM. Research in part supported by the Leibniz Competition 2014.Google Scholar