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Depth Dependence of the Photoelectron Emission Profile for Cathode Lens Microscopy

Published online by Cambridge University Press:  10 August 2018

Yen Huang ,
Tzu-Hung Chuang ,
Chun-I Lu ,
Chih-Heng Huang ,
Deng-Sung Lin ,
Chien-Chen Kuo  and
Der-Hsin Wei
Yen Huang
Affiliation:
Graduate Program of Science and Technology of Synchrotron Light Source, National Tsing Hua University, Hsinchu, Taiwan National Synchrotron Radiation Research Center, Hsinchu, Taiwan
Tzu-Hung Chuang
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu, Taiwan
Chun-I Lu
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu, Taiwan
Chih-Heng Huang
Affiliation:
Program of Synchrotron Radiation and Neutron Beam Applications, National Sun Yat-sen University, Kaohsiung, Taiwan
Deng-Sung Lin
Affiliation:
Graduate Program of Science and Technology of Synchrotron Light Source, National Tsing Hua University, Hsinchu, Taiwan Department of Physics, National Tsing Hua University, Hsinchu, Taiwan
Chien-Chen Kuo
Affiliation:
Program of Synchrotron Radiation and Neutron Beam Applications, National Sun Yat-sen University, Kaohsiung, Taiwan
Der-Hsin Wei*
Affiliation:
Graduate Program of Science and Technology of Synchrotron Light Source, National Tsing Hua University, Hsinchu, Taiwan National Synchrotron Radiation Research Center, Hsinchu, Taiwan Program of Synchrotron Radiation and Neutron Beam Applications, National Sun Yat-sen University, Kaohsiung, Taiwan
*
* Corresponding author, [email protected]

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 154 - 155
Copyright
© Microscopy Society of America 2018 

References

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[4] Patt, M., et al, Rev. Sci. Instrum. 85 2014 113704.CrossRefGoogle Scholar