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Defocus Phase Contrast in Photon-Induced Near-field Electron Microscopy

Published online by Cambridge University Press:  22 July 2022

John H. Gaida ,
Hugo Lourenco-Martins ,
Sergey V. Yalunin ,
Armin Feist ,
Murat Sivis ,
Thorsten Hohage ,
F. Javier García de Abajo  and
Claus Ropers
John H. Gaida*
Affiliation:
Max Planck Institute for Multidisciplinary Sciences, Göttingen, Germany 4th Physical Institute, University of Göttingen, Göttingen, Germany
Hugo Lourenco-Martins
Affiliation:
Max Planck Institute for Multidisciplinary Sciences, Göttingen, Germany 4th Physical Institute, University of Göttingen, Göttingen, Germany
Sergey V. Yalunin
Affiliation:
Max Planck Institute for Multidisciplinary Sciences, Göttingen, Germany 4th Physical Institute, University of Göttingen, Göttingen, Germany
Armin Feist
Affiliation:
Max Planck Institute for Multidisciplinary Sciences, Göttingen, Germany 4th Physical Institute, University of Göttingen, Göttingen, Germany
Murat Sivis
Affiliation:
Max Planck Institute for Multidisciplinary Sciences, Göttingen, Germany 4th Physical Institute, University of Göttingen, Göttingen, Germany
Thorsten Hohage
Affiliation:
Institute of Numerical and Applied Mathematics, University of Göttingen, Göttingen, Germany
F. Javier García de Abajo
Affiliation:
ICFO-Institut de Ciencies Fotoniques, Castelldefels (Barcelona), Spain ICREA-Institució Catalana de Recerca i Estudis Avançats, Barcelona, Spain
Claus Ropers
Affiliation:
Max Planck Institute for Multidisciplinary Sciences, Göttingen, Germany 4th Physical Institute, University of Göttingen, Göttingen, Germany
*
*Corresponding author: [email protected]

Abstract

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Type
Nanoscale Optics with Electrons and Photons
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 1996 - 1998
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Copyright
Copyright © Microscopy Society of America 2022

References

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