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Defect Characterization in Irradiated Nanocrystalline Materials via Automated Crystal Orientation Mapping

Published online by Cambridge University Press:  04 August 2017

Pranav K. Suri ,
James E. Nathaniel ,
Christopher M. Barr ,
Jon K. Baldwin ,
Khalid Hattar  and
Mitra L. Taheri
Pranav K. Suri
Affiliation:
Department of Materials Science and Engineering, Drexel University, Philadelphia, PA 19104
James E. Nathaniel
Affiliation:
Department of Materials Science and Engineering, Drexel University, Philadelphia, PA 19104
Christopher M. Barr
Affiliation:
Department of Materials Science and Engineering, Drexel University, Philadelphia, PA 19104 Ion Beam Laboratory, Sandia National Laboratories, Albuquerque, NM 87185
Jon K. Baldwin
Affiliation:
Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM 87545
Khalid Hattar
Affiliation:
Ion Beam Laboratory, Sandia National Laboratories, Albuquerque, NM 87185
Mitra L. Taheri
Affiliation:
Department of Materials Science and Engineering, Drexel University, Philadelphia, PA 19104

Abstract

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Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 2236 - 2237
Copyright
© Microscopy Society of America 2017 

References

[1] Ackland, G. Science 327 2010 1587.Google Scholar
[2] Beyerlein, I. J., et al, Mater. Today 16 2013 443.CrossRefGoogle Scholar
[3] Bai, X. -M., et al, Science 327 2010 1631.CrossRefGoogle Scholar
[4] Beyerlein, I. J., et al, Prog. Mater. Sci 74 2015 125.Google Scholar
[5] Jenkins, M. L. & Kirk, M. A. Characterization of Radiation Damage by Transmission Electron Microscopy. CRC Press 2000.Google Scholar
[6] Rauch, E. F. & Veron, M. Mater. Charact 98 2014 1.Google Scholar
[7] This work at the Drexel University is supported by the United States Department of Energy, Basic Energy Sciences under the Early Career program through contract DE-SC0008274. This work was performed, in part, at the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science. Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-AC04-94AL85000.Google Scholar