Hostname: page-component-cd9895bd7-dk4vv Total loading time: 0 Render date: 2024-12-25T06:26:16.771Z Has data issue: false hasContentIssue false
  • English
  • Français

Deciphering Liquid Metal Embrittlement and Altered FIB Damage Microstructures on Aluminum

Published online by Cambridge University Press:  30 July 2021

Eric Lang ,
Khalid Hattar ,
Torsten Richter ,
Achim Nadzeyka  and
Kultaransingh Hooghan
Eric Lang
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico, United States
Khalid Hattar
Affiliation:
Sandia National Laboratories, United States
Torsten Richter
Affiliation:
Raith, United States
Achim Nadzeyka
Affiliation:
Raith, United States
Kultaransingh Hooghan
Affiliation:
Qorvo, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 26 - 27
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Bassim, N., et al. MRS Bulletin, 39 (2014), 317-325.CrossRefGoogle Scholar
Giannuzzi, L.A., et al. Micron, 30 (1999), 197–204.Google Scholar
Mayer, J., et al. MRS Bulletin, 32 (2007), 400–407.CrossRefGoogle Scholar
Hugo, R.C. & Hoagland, R.G.. Scripta Materialia, 41 (1999), 1341–1346.CrossRefGoogle Scholar
Lee, S., et al. Acta Materialia, 110 (2016), 283-294.CrossRefGoogle Scholar
Babu, R.P., et al. Acta Materialia, 120 (2016), 391–402.CrossRefGoogle Scholar
Kotula, P.G., et al. MRS Bulletin, 39 (2014), 361-365.CrossRefGoogle Scholar
Thompson, K., et al. Ultramicroscopy, 107 (2007), 131–139.CrossRefGoogle Scholar
Michael, J.R.. Microscopy & Microanalysis, 17 (2011), 386-397.Google Scholar
Tang, F., et al. Acta Materialia, 60 (2012), 1038–1047.CrossRefGoogle Scholar
Gierak, J., et al. Journal of Vacuum Science & Technology B, 36 (2018), 06J101.Google Scholar
Bischoff, L., et al. Applied Physics Reviews, 3 (2016), 021101.CrossRefGoogle Scholar
Zhong, X., et al. Journal of Microscopy (2020), 1-12.Google Scholar
We would like to acknowledge Joe Michael and Daniel Perry for their assitance. This work was supported by the US Department of Energy, Office of Basic Energy Sciences. Sandia National Laboratories is a multi-mission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-NA-0003525.Google Scholar