Hostname: page-component-cd9895bd7-lnqnp Total loading time: 0 Render date: 2024-12-28T04:08:52.420Z Has data issue: false hasContentIssue false
  • English
  • Français

Debye-Waller Factor Measurements by Quantitative Convergent Beam Electron Diffraction (CBED)

Published online by Cambridge University Press:  02 July 2020

M. Saunders ,
A. G. Fox  and
P. A. Midgley
M. Saunders
Affiliation:
Center for Mat. Sei., Dept. of Mech. Eng., Naval Postgraduate School, Monterey, CA93943
A. G. Fox
Affiliation:
Center for Mat. Sei., Dept. of Mech. Eng., Naval Postgraduate School, Monterey, CA93943
P. A. Midgley
Affiliation:
H. H. Wills Physics Laboratory, University of Bristol, Tyndall Avenue, Bristol, UK
Get access

Extract

Quantitative CBED techniques are now capable of making low-order structure factor measure-ments with sufficient accuracy to study bonding effects in crystalline materials. The main limitation of these techniques has been identified as the accuracy with which one knows the Debye-Waller factor(s) (DWF(s)). Even where X-ray measurements exist, values have usually been determined at room temperature whereas we often want to perform our electron diffraction experiments at liquid nitrogen temperatures to reduce the effects of thermal diffuse scattering (TDS). Attempts to calculate theoretical DWF values have been shown to have limited accuracy when compared to experimental measurements.

This has led to a search for new electron diffraction methods for DWF determination such as the use of HOLZ line segments, high-index systematic rows and electron precession patterns. The aim should be to measure the DWF(s) under identical conditions to those used for the charge density studies, e.g. the same sample thickness, temperature and microscope settings.

Type
Analytical Electron Microscopy
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 1011 - 1012
Copyright
Copyright © Microscopy Society of America 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Holmestad, R., et al., Phil. Mag. A 72(1995)579.10.1080/01418619508243787CrossRefGoogle Scholar
2.Saunders, M., et al., Ultramicroscopy 60(1995)311.10.1016/0304-3991(95)00058-1CrossRefGoogle Scholar
3.Bird, D. M. and Saunders, M., Ultramicroscopy 45(1992)241.10.1016/0304-3991(92)90512-ICrossRefGoogle Scholar
4.Sears, V. F. and Shelley, S. A., Acta Cryst. A 47(1991)441.10.1107/S0108767391002970CrossRefGoogle Scholar
5.Niichter, W., et al., in Proc. Micoscopy and Microanalysis (1995)140.10.1017/S0424820100137070Google Scholar
6.Sleight, M. E., et al., in Proc. EUREM 96, (1996)Google Scholar
7.This work was performed while one of the authors (MS) held a National Research Council-Naval Postgraduate School Research Associateship.Google Scholar