Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-24T12:14:02.968Z Has data issue: false hasContentIssue false
  • English
  • Français

Dataflow at the COSMIC Beamline - Stream Processing and Supercomputing

Published online by Cambridge University Press:  10 August 2018

Bjoern Enders ,
Kasra Nowrouzi ,
Harinarayan Krishnan ,
Stefano Marchesini ,
Jungjin Park ,
Young-Sang Yu  and
David A. Shapiro
Bjoern Enders*
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA. University of California at Berkeley, Berkeley, CA 94720, USA.
Kasra Nowrouzi
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA. University of California at Berkeley, Berkeley, CA 94720, USA.
Harinarayan Krishnan
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA.
Stefano Marchesini
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA.
Jungjin Park
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA.
Young-Sang Yu
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA.
David A. Shapiro
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA.
*
*Corresponding author, [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 56 - 57
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Celestre, R., et. al., J. Phys.: Conf. Ser. 849 2017 012047.Google Scholar
[2] Gurzar-Sicarros, M., et.al., Opt. Express 22 2014 14859–14870.Google Scholar
[3] Denes, P., et. al., Rev. Sci. Instrum. 80 2009 083302.CrossRefGoogle Scholar
[4] Marchesini, S., et al., J. Appl. Cryst 49 2016 1245–1252.CrossRefGoogle Scholar
[5] Enders, B. Thibault, P. Proc. R. Soc. A 472 2016 064 http://dx.doi.org/10.1098/rspa.2016.064.Google Scholar
[6] Daurer, B. J., et al, Adv. Struct. and Chem. Imag. 3 2017 7.CrossRefGoogle Scholar