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Data Clustering and Scanning Precession Electron Diffraction for Microanalysis

Published online by Cambridge University Press:  04 August 2017

Benjamin H. Martineau ,
Duncan N. Johnstone ,
Joshua F. Einsle ,
Paul A. Midgley  and
Alexander S. Eggeman
Benjamin H. Martineau
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK
Duncan N. Johnstone
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK
Joshua F. Einsle
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK
Paul A. Midgley
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK
Alexander S. Eggeman
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 116 - 117
Copyright
© Microscopy Society of America 2017 

References

[1] Rauch, EF & Veron, M Eur. Phys. J. Appl. Phys 66 2014). p. 10701.Google Scholar
[2] Portillo, J, et al, Mater. Sci. Forum 644 2010). p. 1.Google Scholar
[3] Lee, DD & Seung, HS Nature 401 1999). p. 788.Google Scholar
[4] Eggeman, AS, Krakow, R & Midgley, PA Nat. Commun 6 2015). p. 7267.CrossRefGoogle Scholar
[5] Bryson, JFJ, et al, Earth Planet. Sci. Lett 388 2014). p. 237.CrossRefGoogle Scholar
[6] The authors acknowledge funding from the Royal Society, the EU's Seventh Framework Programme, grant numbers 320750 and 291522-3DIMAGE, and the EC Seventh Framework Programme, grant number 312483 (ESTEEM2).Google Scholar