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Damage by Induced Electric Field in Beam-sensitive Materials

Published online by Cambridge University Press:  04 August 2017

Nan Jiang
Nan Jiang*
Affiliation:
Department of Physics, Arizona State University, Tempe AZ.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1812 - 1813
Copyright
© Microscopy Society of America 2017 

References

[1] Jiang, N. Report on Progress in Physics 79 2016). p. 016501.Google Scholar
[2] Jiang, N. J. Phys D: Appl. Phys 46 2013). p. 305502.Google Scholar