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CVD diamond/substrate interface FIB preparation of cutting tools

Published online by Cambridge University Press:  21 August 2009

S. B. Peripolli
Affiliation:
Instituto Nacional de Metrologia, Normalização e Qualidade Industrial, Divisão de Metrologia de Materiais - DIMAT, Av. Nossa Senhora das Graças 50, Xerém, Duque de Caxias, RJ - CEP 25250-020, Brazil
F. A. Almeida
Affiliation:
Ceramics Eng. Dept., CICECO, Aveiro University, 3810-193 Aveiro, Portugal
L. S. Gomes
Affiliation:
Instituto Nacional de Metrologia, Normalização e Qualidade Industrial, Divisão de Metrologia de Materiais - DIMAT, Av. Nossa Senhora das Graças 50, Xerém, Duque de Caxias, RJ - CEP 25250-020, Brazil
F. J. Oliveira
Affiliation:
Ceramics Eng. Dept., CICECO, Aveiro University, 3810-193 Aveiro, Portugal
R. F. Silva
Affiliation:
Ceramics Eng. Dept., CICECO, Aveiro University, 3810-193 Aveiro, Portugal
C. A. Achete
Affiliation:
Ceramics Eng. Dept., CICECO, Aveiro University, 3810-193 Aveiro, Portugal Universidade Federal do Rio de Janeiro, Engenharia Metalúrgica e de Materiais, Cx. Postal 68505, Rio de Janeiro, RJ, CEP 21945-970, Brazil

Abstract

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CVD diamond coated cutting tools are used for machining of abrasive and hard materials such as Al-Si alloys and tungsten carbide. The knowledge of the mechanisms governing the diamond/substrate interfacial strength is crucial in cutting tools design. The most adequate substrate material for maximizing the adhesion of diamond films is the silicon nitride (Si3N4) ceramic that possesses a thermal expansion coefficient similar to that of diamond. Buchkremer-Hermanns and co-workers consider the formation of a SiC interlayer between diamond and Si3N4, which may favour chemical bonding to diamond, although they could not detect it by glazing incidence X-Ray diffraction. They believed that insufficient detection sensitivity for very thin films, texture effects or presence of amorphous layers are possible reasons. In the case of TiN substrates, a graded interlayer of amorphous TiCN of only 8 Å was suggested by Contreras, as observed by HRTEM images and EDS measurements. Due to the difficulty in the detection of such layers, which can be in the order of a few angstrons, a definite evidence of their nature is yet to be demonstrated.

Type
Materials Sciences
Copyright
Copyright © Microscopy Society of America 2009