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Correlative Light and Electron Microscopy in Atmosphere

Published online by Cambridge University Press:  25 July 2016

Makoto Nakabayashi ,
Minami Shoji ,
Mai Yoshihara ,
Akiko Hisada  and
Yusuke Ominami
Makoto Nakabayashi
Affiliation:
Hitachi High-Technologies Corporation, Hitachinka-shi, Ibaraki-ken, Japan
Minami Shoji
Affiliation:
Hitachi High-Technologies Corporation, Hitachinka-shi, Ibaraki-ken, Japan
Mai Yoshihara
Affiliation:
Hitachi High-Technologies Corporation, Hitachinka-shi, Ibaraki-ken, Japan
Akiko Hisada
Affiliation:
Hitachi Ltd. Research & Development Group, Hatoyama Saitama-ken, Japan
Yusuke Ominami
Affiliation:
Hitachi High-Technologies Corporation, Hitachinka-shi, Ibaraki-ken, Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 230 - 231
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Ominami, Y., et al., Microscopy 64, 97 (2015).CrossRefGoogle ScholarPubMed
[2] Ominami, Y., et al., Proc. of SPIE Vol. 9236 923604-1 (2014).Google Scholar