Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-28T21:40:29.743Z Has data issue: false hasContentIssue false
  • English
  • Français

Correlative Light and Electron Microscopy for Materials Science

Published online by Cambridge University Press:  23 September 2015

Jessica L. Riesterer  and
Gregor Heiss
Jessica L. Riesterer
Affiliation:
FEI Company, Hillsboro, OR, USA
Gregor Heiss
Affiliation:
FEI Company, Hillsboro, OR, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 165 - 166
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Snyder, M.A., et al., Micropor. Mesopor. Mat 76 (2004). p. 29.CrossRefGoogle Scholar
[2] Van Leer, B. & Passey, R. 18th International Microscopy Conference, Prague, ISBN 978-80-2606720-7 (2014) p. 181.Google Scholar
[3] http://www.mindat.org/min-1617.html.Google Scholar
[4] Venkateswaran, C. S., Proc. IISc 2 (1935). p. 459.Google Scholar