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Correlative Confocal and Environmental Scanning Electron Microscopy for Investigating the Fungal Invasion of Plant Surfaces in Their Native State

Published online by Cambridge University Press:  04 August 2017

Andrew J. Bowling ,
Heather E. Pence ,
Thomas Slanec  and
Leah L. Granke
Andrew J. Bowling
Affiliation:
Dow AgroSciences, Indianapolis, IN, 46268
Heather E. Pence
Affiliation:
Dow AgroSciences, Indianapolis, IN, 46268
Thomas Slanec
Affiliation:
Dow AgroSciences, Indianapolis, IN, 46268
Leah L. Granke
Affiliation:
Dow AgroSciences, Indianapolis, IN, 46268

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1336 - 1337
Copyright
© Microscopy Society of America 2017 

References

[1] Fones, H & Gurr, S Fungal Gen. and Biol. 79 2015). p. 3.CrossRefGoogle Scholar
[2] Troughton, JH & Hall, DM Aust. J. Biol. Sci. 20 1967). p. 509.Google Scholar