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Correlative Characterization of Graphene with the Linkage of SEM and KFM

Published online by Cambridge University Press:  25 July 2016

Y. Hashimoto ,
T. Yamaoka ,
S. Takeuchi ,
T. Sunaoshi ,
A. Miyaki ,
M. Sasajima ,
A. Muto  and
J. Yu
Y. Hashimoto
Affiliation:
Application Development Dept., Hitachi High-Technologies Corporation, Hitachinaka, Japan
T. Yamaoka
Affiliation:
Analytical Application Engineering Section Tokyo2, Hitachi High-Tech Science Corporation, Kawasaki, Japan
S. Takeuchi
Affiliation:
Application Development Dept., Hitachi High-Technologies Corporation, Hitachinaka, Japan
T. Sunaoshi
Affiliation:
Application Development Dept., Hitachi High-Technologies Corporation, Hitachinaka, Japan
A. Miyaki
Affiliation:
Application Development Dept., Hitachi High-Technologies Corporation, Hitachinaka, Japan
M. Sasajima
Affiliation:
Electron Microscope Systems Design 1st Dept., Hitachi High-Technologies Corporation, Hitachinaka, Japan
A. Muto
Affiliation:
Nanotechnology Systems Div., Hitachi High Technologies America, Inc., Clarksburg, USA
J. Yu
Affiliation:
Nanotechnology Systems Div., Hitachi High Technologies America, Inc., Clarksburg, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 226 - 227
Copyright
© Microscopy Society of America 2016 

References

References:

[1] McCann, E. Phys. Rev. B 74(161403(R) (2006).Google Scholar
[2] Kochat, Vidya, et al., Journal of Applied Physics 110(014315 (2011).Google Scholar
[3] Yu, J., et al., Journal of Physics: Conference Series 483 (2014) 012002.Google Scholar